Aim: The aim of this study was to assess if the curing mode and the etching mode could affect the push-out bond strength of different post cementation systems using two universal adhesives. Materials and methods: A total of 100 single-rooted teeth were divided into Prime & Bond Elect (PBE), Prime & Bond Active (PBA), and Prime & Bond XP (PBXP) as a control. The PBE, PBA, and PBXP were used in the self-etch (SE) and etch and rinse (E&R) mode. Post cementation was performed using Core X flow used in dark-cure and in light-cure. Data were analyzed using the one-way ANOVA test and post hoc Bonferroni and Dunnet tests. The Student's t test was performed to find significance between two independent groups. Results: Bond strength was significantly influenced by the adhesive strategies. The PBE and PBA obtained higher values when used in the SE mode (p < 0.001). Light-cured groups obtained significantly higher values (p < 0.001) compared to dark-cured groups. The post space region also had a significant effect on the bond strength; the apical third recorded lower values in all groups (p < 0.001). Conclusion: The PBA and PBE universal adhesives obtained higher PBS values when used in the SE mode and followed by the light-curing of resin cement. Clinical significance: Universal adhesives represent a good alternative to the conventional total-etch adhesive system for fiber post cementation. Since they perform better in SE, they would be recommendable in clinical practice, as they can be used with a simplified technique.